New electron microscopy techniques can probe structural, physical and chemical properties of materials with spatial resolution ranging from atomic to macroscopic length scales, with impact across a broad range of disciplines in the physical and the life sciences, and with commercial applications.

The 2016 Cornell Center for Materials Research Symposium, “Novel Characterization Methods – Advances in Electron Microscopy,” May 25 at the Physical Sciences Building, will showcase recent advances including in-situ transmission electron microscopy to track crystal growth and electrochemical processes, cryo-electron microscopy to reveal the 3-D structure of molecules and interfaces between liquid and solids, and aberration-corrected scanning electron microscopy to map magnetic fields.

The program will open at 8:45 a.m. with the 2016 Sproull Lecture, “Molecular Machines Captured in Motion at High Resolution by Single-Particle Cryo-EM,” by Joachim Frank, professor of biochemistry and molecular biophysics and of biological sciences at Columbia University.

Other invited speakers are Richard Leapman, chief of the Laboratory of Cellular Imaging and Macromolecular Biophysics at the National Institute of Biomedical Imaging and Bioengineering; Darrin Pochan, professor of materials science and engineering at the University of Delaware; Rafal Dunin-Borkowski, director of the Institute for Microstructure Research and the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Germany; and Philip Batson, professor of physics and astronomy at Rutgers University.

Cornell speakers are Lena Kourkoutis and David Muller, professors of applied and engineering physics, and graduate student Megan Holtz.

A poster session will be held in the Clark Atrium.

Registration is free to Cornell faculty and students.